报告题目：Modern surface metrology and application in advanced manufacturing
报告人：Dr Wenjuan Sun(National Physical Laboratory, United Kingdom)
Surface metrology is widely used in many industries including automotive and aerospace. The significant growth of advanced manufacturing, requires measurements of surfaces with complex external and internal structures, where conventional 2D profile measurements and destructive measurements cannot meet the needs. The talk will discuss challenges faced in advanced manufacturing and will introduce the latest development of surface metrology at the National Physical Laboratory (NPL), UK. Several case studies will be given. The talk will also introduce the current state-of-the-art traceable measurement framework at NPL and the latest development of international standards in the field of surface metrology.
Dr Wenjuan Sun is EPSRC tomography roadmap, working group member, Dimensional X-ray Computed Tomography(XCT) Conference Conference Chair, Co-chair , UK user group coordinator, International Organization for Standardization, British Standards Institute committee ISO/TC 213 WG10, WG16 Committee member, National Physical Laboratory, UK X-ray computed tomography Project formulation, project management PhD student supervisor, national and international secondments. Main area of interests: X-ray Computed tomography, Optical CMM, Additive Manufacturing.